Proceedings of the International scientific and practical conference ― Education and Scientific Progress‖ (February 13-15, 2026) / Publisher website: www.naukainfo.com. - Manchester, United Kingdom, 2026. - 206 p.

128 Fig. 1. Determination of optical properties using PRISA For the analysis, the PRISA software was applied to the measured optical transmittance data in the 500-2000 nm range. The extracted parameters were a film thickness of d = 1478 nm, a static (zero-frequency) refractive index of n 0 = 2.6, and an optical band gap of E g = 1.52 eV. The thickness is in good agreement with the profilometer result of 1490 nm. The small discrepancy can be attributed to measurement uncertainties in both the transmittance measurements and the profilometer thickness determination. Conclusions The PRISA software was used to determine the optical properties of thin CdTe films deposited on glass substrates by vacuum thermal evaporation. The film thickness measured experimentally was 1490 nm, while the thickness extracted from the transmittance spectrum was 1478 nm, demonstrating good agreement and indicating high accuracy of the method. The extracted optical parameters were a static refractive index n0 = 2.6 and an optical band gap Eg = 1.52 eV. These results highlight the potential of the obtained films for fabricating efficient CdTe/CdS heterostructure solar cells.